Japanese Translation for Test

The AFM-1000 from Semilab is a versatile atomic force microscope designed for both academic research and semiconductor industry applications. This compact system offers high-resolution, sub-atomic precision measurements with extremely low noise levels, ideal for consistent nanotopography measurements and electrical characterization of various samples up to 65x65 mm in size.

With cutting-edge technology and decades of knowhow, Semilab tabletop AFM system provides to your academic research microscopic measurement solutions based on semiconductor industry standards.