inSE-1000 Spectroscopic Ellipsometry
This high-performance, non-contact, non-destructive optical metrology tool provides precise measurement of thin film thickness and optical constants across single and multilayer structures. Designed for R&D labs, universities, and industries like semiconductor, PV and optics, it supports advanced modeling, mapping, and real-time data visualization.
関連出版物
Ammonia-vapour-induced two-layer transformation of mesoporous silica coatings on various substrates
Amphiphilic nanopores that condense undersaturatedwater vapor and exude water droplets
Analysis of malaria infection byproducts with Mueller matrix transmission ellipsometry
Beyond the Meso-/Macroporous boundary: Extending Capillary Condensation-based Pore Size Characterization in Thin Films Through Tailored Adsorptives
Block copolymer-assembled nanopore arrays enable ultrasensitive label-free DNA detection
Detection of structural asymmetries in Forksheet FET arrays using Mueller matrix ellipsometry, a theoretical study
Internal wettability investigation of mesoporous silica materials by ellipsometric porosimetry
Monitoring subwavelength grating structures for vertical-cavity surface-emitting laser applications by spectroscopic ellipsometry
Near-infrared optical properties and proposed phase-change usefulness of transition metal disulfides
On the Rational Design of Mesoporous Silica Humidity Sensors
Spectroscopic ellipsometry investigation of free liquid-liquid and liquid-air interfaces
Structural Evolution of Silicon Nitride Anodes during Electrochemical Lithiation
The influence of stabiliser concentration on the formation of In2O3 thin films
関連ホワイトペーパー
August 18, 2025
Forksheet FET - the Future of Transistor Manufacturing?
Semilab, within the IT2 EU project, explores Mueller matrix ellipsometry as a powerful method to detect asymmetries in forksheet FETs—offering enhanced precision over conventional techniques and supporting Europe's push for semiconductor innovation.
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How Does Advanced Metrology Benefit the PV Industry?
Explore how advanced metrology plays a crucial role in the photovoltaic industry by enhancing efficiency, ensuring quality control, supporting research and development, and reducing costs.
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How Spectral Ellipsometry Measurements are Conducted on Bulk Liquids
Enabling precise optical characterization of bulk liquids using advanced spectral ellipsometry despite interface instability.
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How to Determine the Internal Wettability of Nanostructured Thin Films
Advancing wettability analysis of nanostructured thin films with ellipsometric porosimetry and spectral ellipsometry.
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Precision Measurement Tools for the Sub-Nanoscale
Real-time in situ spectroscopic ellipsometry reveals key insights into sub-nanoscale growth of molybdenum carbide thin films.
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R&D Keeps The World Moving Forward - So Are Semilab’s Spectroscopic Ellipsometry Solutions
Technological development is transforming every aspect of our lives and our world at an unprecedented rate, and Semilab proudly contributes to this incredible pace.
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R&D Lab Tools for the Display Industry
Innovation in the electronic display industry is driven by advanced R&D tools enabling precise measurement and development.