AFM-2000 Atomic Force Microscopy
The AFM-2000 is Semilab’s high-end atomic force microscope, delivering high-resolution, sub-atomic precision measurements for both academic research and semiconductor industry applications. Ideal for surface roughness and critical dimension control, it offers a large sample stage movement range of 200 × 250 mm with full automation capability—making it ideal for both R&D and industrial quality control.
関連出版物
Ballistic Electron Emission Microscopy of Schottky Diodes on RF-Plasma-Treated Silicon
Breast adenocarcinoma cells adhere stronger to brain pericytes than to endothelial cells
Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces
Kelvin Force Probe Microscopy of Ferroelectric Si: HfO2
Nanomechanical Properties of Ion-Implanted Si
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Pushing Size Limits in the Semiconductor Industry and Metrology
Unlock the true potential of AFM with the Semilab AFM product family, elevating your understanding of materials for research and manufacturing excellence. Meet our newest addition, the AFM-3000.
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Tailored Surface Characterization Tools for R&D
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