Kelvin Force Probe Microscopy of Ferroelectric Si: HfO2
掲載誌: Meeting Abstracts - The Electrochemical Society
年: 2017
著者: Dmitriy Marinskiy, Patrick Polakowski, Jacek Lagowski, Marshall Wilson, Piotr Edelman, Johannes Müller
corona - KelvinNon-Contact MeasurementTHIN FILM CHARACTERIZATION
出版物を読むECS Meeting Abstracts contain extended abstracts of the technical papers presented at ECS meetings and ECS-sponsored meetings. This publication offers a first look into the current research in the field. ECS Meeting Abstracts are freely available to all visitors to the ECS Digital Library.
