DLS-1100 Deep Level Transient Spectroscopy
The DLS-1100 is a high-end DLTS system designed for semiconductor R&D and production environments. Featuring an external cryostat for precise temperature control, it offers top-tier sensitivity, full automation, and advanced customization — ideal for production labs, foundries, and high-throughput research facilities.
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Analytical Tools for the Characterization of Power Devices
Ballistic Electron Emission Microscopy of Schottky Diodes on RF-Plasma-Treated Silicon
DLTS Investigation of Deep Levels in Bulk GaAs under Uniaxial Stress
Diffusion of Iron in Silicon Dioxide
Homogeneous Transparent Conductive ZnO:Ga by ALD for Large LED Wafers
Interpretation of the Electric Field Dependent Thermal Emission Data of Deep Traps
Investigation of Deep Levels and Precipitates Related to Molybdenum in Silicon by DLTS and Scanning Infrared Microscopy
NIST Traceable Small Signal Surface Photo Voltage Reference Wafer
Quantitative shear stress imaging in high throughput in-line Si wafer inspection
Temperature Dependence of the Capture Cross Section of Seo as Measured by Microwave Absorption Spectroscopy (MAS)
Three Dimensional Mapping of Thermal and Tunneling Electron Emission from InAs/GaAs Quantum Dots
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