Carrier Lifetime Analysis by Photoconductive Decay and Free Carrier Absorption Measurements
掲載誌: J. Electrochem. Soc.148 2001) 11, p. G655.-G661.
年: 2001
著者: H-J. Schulze, A. Frohnmeyer, F.-J. Niedernostheide, F. Hille, P. Tüttő, T. Pavelka, G. Wachutka
Silicon (Si)elemental semiconductorscarrier lifetimephotoconductivity
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