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The AFM-1000 from Semilab is a versatile atomic force microscope designed for both academic research and semiconductor industry applications. This compact system offers high-resolution, sub-atomic precision measurements with extremely low noise levels, ideal for consistent nanotopography measurements and electrical characterization of various samples up to 65x65 mm in size.
With cutting-edge technology and decades of knowhow, Semilab tabletop AFM system provides to your academic research microscopic measurement solutions based on semiconductor industry standards.
Author
Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh
Topic
adhesion assay; Zeiss AFM; single-cell force spectroscopy
Author
P.M. Nagy, D. Aranyi, P. Horváth, G. Pető, E. Kálmán
Topic
nanoindentation; Ion Implantation; mechanical properties; AFM
September 17, 2025
Unlock the true potential of AFM with the Semilab AFM product family, elevating your understanding of materials for research and manufacturing excellence. Meet our newest addition, the AFM-3000.
September 17, 2025
Exploring how tailored surface characterization tools enhance R&D by boosting material insights, productivity, and competitive advantage.