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Author
András Bojtor, Dávid Krisztián, Gábor Paráda, Ferenc Korsós, Sándor Kollarics, Gábor Csősz, Bence G. Márkus, László Forró, Ferenc Simon
Topic
Carrier generation & recombination; Metrology; Optoelectronics; Photoconductivity; Radio frequency techniques; Devices; Semiconductors; Microwave techniques
Author
Tamás Tarjányi, Csaba Rosztóczy, Ferenc Peták, Fruzsina Kun-Szabó, Gábor Gulyás, József Tolnai, Krisztián Bali, Petra Somogyi, Rebeka Anna Kiss, Gergely H. Fodor
Topic
nanoindentation; diabetes mellitus; rib bone; dynamic loading; aging; IND
Author
Tamás Tarjányi, Gábor Gulyás, Krisztián Bali, Márton Sámi, Rebeka Anna Kiss, Barbara Beiler, Péter Fürjes, Tibor Szabó
Topic
nanoindentation; hardness; creep; wafer; SU-8; epoxy
Author
Xian Xiao, Aimei Yang, Hanbin Zhang, Demian Park, Yangdong Wang, Balint Szabo, Edward S. Boyden, Kiryl D. Piatkevich
Topic
infrared; voltage measurement
Author
Baekmin Q. Kim, Zachariah Vicars, Máté Füredi, Lilia F. Escobedo, R. Bharath Venkatesh, Stefan Guldin, Amish J. Patel, Daeyeon Lee
Topic
ellipsometry; spectroscopic ellipsometry; spectroscopic ellipsometry; mapping; in-situ heating; vacuum chamber; NANO SURFACE CHARACTERIZATION
Author
D. Ullrich, Z. Bozóki, B. M. Kovács, Ö. Sepsi, F. Ujhelyi, Z. Zolnai, J. Szivós, G. Nádudvari, L. Balogh
Topic
Ion Implantation; Photomodulated Reflection measurements; Silicon (Si); silicon carbide (SiC); ION IMPLANT MONITORING
Author
Baekmin Q. Kim1†, Zachariah Vicars1†, Máté Füredi2,3, Lilia F. Escobedo1, R. Bharath Venkatesh1‡, Stefan Guldin2,4,5, Amish J. Patel1*, Daeyeon Lee1
Topic
spectroscopic ellipsometry
Author
Emőke Albert*; Péter Basa, Bálint Fodor; Zsófia Keresztes, János Madarász, Péter Márton, Dániel Olasz, Adél Sarolta Rácz, György Sáfrán, Tamás Szabó, Borbála Tegze, Tibor Höltzl, Zoltán Hórvölgyi
Topic
EP (ellipsometric porosimetry)
Author
R. J. Quinn1, Y. Go2, A.B. Naden 3, A. Bojtor, G. Paráda, A. K. M. A. Shawon 5, K. Domosud 6, K. Refson 6, A. Zevalkink 5, N. Neophytou 2, J. W. G. Bos 3
Topic
Hall effect
Author
Adam J. Lovett*, Máté Füredi, Liam Bird, Samia Said, Brandon Frost, Paul R. Shearing, Stefan Guldin, Thomas S. Miller*
Topic
spectroscopic ellipsometry
Author
András Bojtor, Dávid Krisztián, Gábor Paráda, Ferenc Korsós, Sándor Kollarics, Gábor Csősz, Bence G. Márkus, László Forró, Ferenc Simon
Topic
uPCD
Author
Maximiliano Jesus Jara Fornerod, Alberto Alvarez-Fernandez, Máté Füredi, Anandapadmanabhan A Rajendran, Beatriz Prieto-Simón, Nicolas H. Voelcker, Stefan Guldin
Topic
spectroscopic ellipsometry
Author
Tamas Tarjanyi, Andras Gabor Jakab, Marton Sami, Krisztian Bali, Ferenc Rarosi, Maja Laura Jarabik, Gabor Braunitzer, Daniel Palkovics, Lippo Lassila, Edina Lempel, Mark Frater, Sufyan Garoushi
Topic
nanoindentation; COMPOUND MATERIAL CHARACTERIZATION
Author
Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh
Topic
adhesion assay; Zeiss AFM; single-cell force spectroscopy
Author
Mikio Fukuhara, Tomonori Yokotsuka, Tetsuo Samoto, Masahiko Kumadaki, Mitsuhiro Takeda, Toshiyuki Hashida
Topic
Hall effect measurements; Materials science; Organic contamination; semiconductor; semiconductor materials; Semiconductor Devices; NANO HARDNESS; PDL Hall
Author
Boglárka Dikó, Roberta Zsófia Kiss, Dávid Egri, Emeric Balogh
Topic
Defect detection; defect inspection; defects; ellipsometry; Materials science; spectroscopic ellipsometry
Author
Péter Márton, Adél Rácz, Beáta Szolnoki, János Madarász, Norbert Nagy, Bálint Fodor, Péter Basa, János Rohonczy, Zoltán Hórvölgyi
Topic
ellipsometry; XPS; ellipsometry porosimetry; THIN FILM THICKNESS MEASUREMENT; FTIR REFLECTOMETRY; Porosimetry; nanostructural coating; atomic layer deposition
Author
E. E. Najbauer, L. Sinkó, Sz. Biró, Z. Durkó, P. Basa
Topic
carrier density; epitaxial layer; semiconductor; Silicon (Si); SRP-2100; SRP; FTIR REFLECTOMETRY
Author
Béla Hopp, Márton Sámi, Tamás Gera, Judit Budai, Gergő Ballai, Lázár Tóth, János Bohus, Gábor Gulyás, Tamás Szörényi, Tamás Smausz
Topic
nanoindentation; Surface; Surface measurement; surface treatment; NANO SURFACE CHARACTERIZATION
Author
András Bojtor, Dávid Krisztián, Ferenc Korsós, Sándor Kollarics, Gábor Paráda, Thomas Pinel, Márton Kollár, Endre Horváth, Xavier Mettan, Hidetsugu Shiozawa, Bence G. Márkus, László Forró, Ferenc Simon
Topic
carrier density; carrier lifetime; Carrier mobility; Charge Carrier Lifetime; Charge carriers; photovoltaics; PV; recombination; Charge carrier density; PDL Hall
Author
Jorge Luis Vazquez-Arce, Tibor Suta, Bálint Fodor, László Makai, Oscar Contreras, Amin Bahrami, Kornelius Nielsch, Hugo Tiznado
Topic
Ellipsometers; ellipsometry; optical inspection; oxidation; spectroscopic ellipsometry; Optical metrology; atomic layer deposition
Author
Zsolt Kovács, Csanád Ö. Boros, Teodóra N. Kovács, Zsolt Kovács, ZoltánT. Kiss
Topic
optical inspection; Silicon (Si); POLARIZED INFRARED IMAGING; VISUAL INSPECTION
Author
Máté Füredi, Cristina V. Manzano, András Marton, Bálint Fodor, Alberto Alvarez-Fernandez,*
Topic
EP
Author
DR. JAKAB ANDRÁS, DR. VÁNKAY KATA LILLA, DR. TARJÁNYI TAMÁS, GULYÁS GÁBOR, BALI KRISZTIÁN DÉZSI PÁL PATRIK, SÁMI MÁRTON DR. FRÁTER MÁRK
Topic
nanoindentation
Author
Gergely Havasi, Dávid Krisztián, (Zs. Gombás -BME-, Z. Ádám -EcoSolifer Heterojunction Ltd.), Ferenc Korsós
Topic
laser controlled photoconductance decay (PCD)
Author
Balogh Imre, Kiss Roberta Zsófia, Egri Dávid
Topic
spectroscopic ellipsometry
Author
Andás Bojtor, Dávid Krisztián, Ferenc Korsós, Sándor Kollarics (3,4), Gábor Paráda, Márton Kollár (5), Endre Horváth (5), Xavier Mettan (5), Bence G. Márkus (6, 3, 4), László Forró (6), Ferenc Simon (6, 7, 1, 3)
Topic
perovskites; photoconductivity; photonic applications; charge-carrier lifetime
Author
Roger Loo, Anjani Akula, Yosuke Shimura, Clement Porret, Erik Rosseel, Thomas Dursap, Andriy Yakovitch Hikavyy, Matteo Beggiato, Janusz Bogdanowicz, Alex Merkulov, Mustafa Ayyad, Han Han, Olivier Richard, Andrea Impagnatiello, Dong Wang, Keisuke Yamamoto, Tamás Sipőcz, Árpád Kerekes, Hans Mertens, Naoto Horiguchi and Robert Langer
Topic
rt pl
Author
Gergely Havasi, Dávid Krisztián, Ferenc Korsós, Shaoyong Fu
Topic
laser controlled photoconductance decay (PCD)
Author
Gyorgy Nadudvari, Zoltan Kiss, Csenge Dobos, Lukács Bokody, Zsolt Kovács, Gábor Molnár, Dénes Száz, Silvia Poppa, Imre Balogh
Topic
IR