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Semilab delivers high-precision characterization tools for R&D in Material and Life Sciences, supporting innovation from nanotechnology to biomedical applications.
Semilab has a strong scientific background and a long history of excellent cooperation with academic customers to develop tailored solutions for R&D applications in the semiconductor, photovoltaic and flat panel display industries, thin film research, materials science, and related scientific disciplines.
Material Science
Compact, lab-grade tools for precise electrical resistivity measurement in semiconductor and materials research
Non-contact, high-sensitivity mapping
Advanced impurity characterization tools
Accurate thin film analysis
Precision texture and topography mapping
Life Science
Interviews, tips, guides, industry best practices, and news

September 17, 2025
Unlock the true potential of AFM with the Semilab AFM product family, elevating your understanding of materials for research and manufacturing excellence. Meet our newest addition, the AFM-3000.

September 17, 2025
Exploring how tailored surface characterization tools enhance R&D by boosting material insights, productivity, and competitive advantage.

November 26, 2025
In the Power and Automotive industries, one of the biggest challenges is ensuring stable implantation parameters and precise control over the implantation process. These challenges are especially critical in the electrification era.
Read our latest publications
Author
András Bojtor, Dávid Krisztián, Gábor Paráda, Ferenc Korsós, Sándor Kollarics, Gábor Csősz, Bence G. Márkus, László Forró, Ferenc Simon
Topic
Carrier generation & recombination; Metrology; Optoelectronics; Photoconductivity; Radio frequency techniques; Devices; Semiconductors; Microwave techniques
Author
Tamás Tarjányi, Csaba Rosztóczy, Ferenc Peták, Fruzsina Kun-Szabó, Gábor Gulyás, József Tolnai, Krisztián Bali, Petra Somogyi, Rebeka Anna Kiss, Gergely H. Fodor
Topic
nanoindentation; diabetes mellitus; rib bone; dynamic loading; aging; IND
Author
Tamás Tarjányi, Gábor Gulyás, Krisztián Bali, Márton Sámi, Rebeka Anna Kiss, Barbara Beiler, Péter Fürjes, Tibor Szabó
Topic
nanoindentation; hardness; creep; wafer; SU-8; epoxy