COREMA-2000 Contactless Resistivity Mapping

The COREMA-2000 series offers precise, non-destructive, contactless resistivity measurement solutions designed primarily for semi-insulating compound semiconductor substrates, such as SiC, GaN, GaAs, CdTe, GaO, and InP. It supports both research and industrial semiconductor manufacturing environments with high accuracy and repeatability.

With its new, specially designed and more stable Corema-2000 Gen2 platform and custom built software, Semilab offers the next level of excellence in routine production control for radio frequency, photonics and high-power electronics manufacturers.