Lehighton-2000RS Sheet Resistance and Mobility Measurement

The Lehighton-2000RS is a high-throughput, non-contact metrology system designed for precise sheet resistance characterization of compound semiconductor wafers. Ideal for advanced R&D and production environments, it supports a wide range of materials, delivering reliable and reproducible results with flexible automation options.

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Extremely low surface recombination velocities on low‐resistivity n‐type and p‐type crystalline silicon using dynamically deposited remote plasma silicon nitride films

Author: Shubham Duttagupta, Fen Lin, Marshall Wilson, Matthew B Boreland, Bram Hoex, Armin G Aberle

corona-voltage metrologyNon-Contact Measurementphotovoltaicssilicon defect density

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From GaAs to SiC: Measuring Resistivity in Compound Semiconductors

Discover why accurate resistivity measurement is the key to unlocking the full potential of compound semiconductors in powering the future of energy, mobility, and high-frequency technologies.

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