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The AFM-2000 is Semilab’s high-end atomic force microscope, delivering high-resolution, sub-atomic precision measurements for both academic research and semiconductor industry applications. Ideal for surface roughness and critical dimension control, it offers a large sample stage movement range of 200 × 250 mm with full automation capability—making it ideal for both R&D and industrial quality control.
Author
L. Quattropani, K. Solt, P. Niedermann, I. Maggio-Aprile, O. Fischer, T. Pavelka
Topic
Schottky diode; RF plasma treated silicon
Author
Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh
Topic
adhesion assay; Zeiss AFM; single-cell force spectroscopy
Author
D. Marinskiy, P. Edelman, A.D. Snider
Topic
Kelvin force microscopy; corona charge; concentration profile; surface diffusion
Author
Dmitriy Marinskiy, Patrick Polakowski, Jacek Lagowski, Marshall Wilson, Piotr Edelman, Johannes Müller
Topic
corona - Kelvin; Non-Contact Measurement; THIN FILM CHARACTERIZATION
Author
P.M. Nagy, D. Aranyi, P. Horváth, G. Pető, E. Kálmán
Topic
nanoindentation; Ion Implantation; mechanical properties; AFM
September 17, 2025
Unlock the true potential of AFM with the Semilab AFM product family, elevating your understanding of materials for research and manufacturing excellence. Meet our newest addition, the AFM-3000.
September 17, 2025
Exploring how tailored surface characterization tools enhance R&D by boosting material insights, productivity, and competitive advantage.