AFM-2000 Atomic Force Microscopy
The AFM-2000 is Semilab’s high-end atomic force microscope, delivering high-resolution, sub-atomic precision measurements for both academic research and semiconductor industry applications. Ideal for surface roughness and critical dimension control, it offers a large sample stage movement range of 200 × 250 mm with full automation capability—making it ideal for both R&D and industrial quality control.
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