Semilab

DLS-1100 Deep Level Transient Spectroscopy

The DLS-1100 is a high-end DLTS system designed for semiconductor R&D and production environments. Featuring an external cryostat for precise temperature control, it offers top-tier sensitivity, full automation, and advanced customization — ideal for production labs, foundries, and high-throughput research facilities.

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Analytical Tools for the Characterization of Power Devices

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Applied Surface Science,70/71, 391-3951993

Ballistic Electron Emission Microscopy of Schottky Diodes on RF-Plasma-Treated Silicon

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Diffusion of Iron in Silicon Dioxide

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Homogeneous Transparent Conductive ZnO:Ga by ALD for Large LED Wafers

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International Conference on Frontiers of Characterization and Metrology, 20072007

NIST Traceable Small Signal Surface Photo Voltage Reference Wafer

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optical inspectionSilicon (Si)POLARIZED INFRARED IMAGINGVISUAL INSPECTION
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Temperature Dependence of the Capture Cross Section of Seo as Measured by Microwave Absorption Spectroscopy (MAS)

Author: T. Pavelka and B. Hemm
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Appl.Phys.Letters 91, 0331102007

Three Dimensional Mapping of Thermal and Tunneling Electron Emission from InAs/GaAs Quantum Dots

Author: O. Engström, M.Kaniewska, W.Jung, M.Kaczmarczyk
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