Interpretation of the Electric Field Dependent Thermal Emission Data of Deep Traps

The paper considers the consequesnces of recapture of carriers from the Debye-tail taking place simultaneously with thermal emission from deep traps in the space charge region of a semiconductor diode. The importance of the mentioned process in the field dependent thermal emission investigations is demonstrated by DLTS measurements. It is shown that disregard of the recapture mechanism can lead to misinterpretations.