Semilab

Evaluation of Advanced Pre-Gate Cleanings

Published to: Cleaning Technology in Semiconductor Device Manufacturing, Proceedings of the Sixth International Symposium Oct.1999), Vol. 99-36, pages 59-68
Year: 1999
Author: C. Cowache, P. Boelen, I. Kashkoush, P Besson, F. Tardif
pre-gate cleaningparticle removalmetal removalsurface microroughnesssurface passivation
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