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New µ-PCD Based Method for Sorting Boron and Gallium Doped Feedstock Material
Published to:
European Photovoltaic Solar Energy Conference and Exhibition
Year:
2011
Author:
F. Korsós, G. Paráda, D. Fátay
Wafer-Based Silicon Solar Cells
Silicon Feedstock
Crystallisation
Wafering
Microwave Photoconductive Decay (μ-PCD)
carrier lifetime
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WT-2000 Wafer Tester
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