세미랩 기술을 활용한 동료심사 논문.
337개의 출판물이 발견되었습니다
저자: András Bojtor, Dávid Krisztián, Gábor Paráda, Ferenc Korsós, Sándor Kollarics, Gábor Csősz, Bence G. Márkus, László Forró, Ferenc Simon
주제: Carrier generation & recombination; Metrology; Optoelectronics; Photoconductivity; Radio frequency techniques; Devices; Semiconductors; Microwave techniques
저자: Laszlo Makai, Csaba Balogh, Peter Basa, Jonas Haunschild
주제: Ellipsometry; Photovoltaics; Monocrystalline textured; TOPCon
저자: Oleg Rusch, Julien Körfer, Boglárka Dikó, Zsófia Kiss, Attila Sütő, Emeric Balogh
주제: trench MOSFET; OCD; critical dimension metrology; ellipsometry; reflectometry
저자: Zsombor Pap, Bálint Fodor, Julien Körfer, Mathias Rommel, László Makai
주제: spectroscopic ellipsometry; thin oxide layer measurements; backside reflection; brewster’s angle
저자: Tamás Tarjányi, Csaba Rosztóczy, Ferenc Peták, Fruzsina Kun-Szabó, Gábor Gulyás, József Tolnai, Krisztián Bali, Petra Somogyi, Rebeka Anna Kiss, Gergely H. Fodor
주제: nanoindentation; diabetes mellitus; rib bone; dynamic loading; aging; IND
저자: Tamás Tarjányi, Gábor Gulyás, Krisztián Bali, Márton Sámi, Rebeka Anna Kiss, Barbara Beiler, Péter Fürjes, Tibor Szabó
주제: nanoindentation; hardness; creep; wafer; SU-8; epoxy
저자: Xian Xiao, Aimei Yang, Hanbin Zhang, Demian Park, Yangdong Wang, Balint Szabo, Edward S. Boyden, Kiryl D. Piatkevich
주제: infrared; voltage measurement
저자: Baekmin Q. Kim, Zachariah Vicars, Máté Füredi, Lilia F. Escobedo, R. Bharath Venkatesh, Stefan Guldin, Amish J. Patel, Daeyeon Lee
주제: ellipsometry; spectroscopic ellipsometry; spectroscopic ellipsometry; mapping; in-situ heating; vacuum chamber; NANO SURFACE CHARACTERIZATION
저자: D. Ullrich, Z. Bozóki, B. M. Kovács, Ö. Sepsi, F. Ujhelyi, Z. Zolnai, J. Szivós, G. Nádudvari, L. Balogh
주제: Ion Implantation; Photomodulated Reflection measurements; Silicon (Si); silicon carbide (SiC); ION IMPLANT MONITORING
저자: Baekmin Q. Kim1†, Zachariah Vicars1†, Máté Füredi2,3, Lilia F. Escobedo1, R. Bharath Venkatesh1‡, Stefan Guldin2,4,5, Amish J. Patel1*, Daeyeon Lee1
주제: spectroscopic ellipsometry
저자: Emőke Albert*; Péter Basa, Bálint Fodor; Zsófia Keresztes, János Madarász, Péter Márton, Dániel Olasz, Adél Sarolta Rácz, György Sáfrán, Tamás Szabó, Borbála Tegze, Tibor Höltzl, Zoltán Hórvölgyi
주제: EP (ellipsometric porosimetry)
저자: R. J. Quinn1, Y. Go2, A.B. Naden 3, A. Bojtor, G. Paráda, A. K. M. A. Shawon 5, K. Domosud 6, K. Refson 6, A. Zevalkink 5, N. Neophytou 2, J. W. G. Bos 3
주제: Hall effect
저자: Adam J. Lovett*, Máté Füredi, Liam Bird, Samia Said, Brandon Frost, Paul R. Shearing, Stefan Guldin, Thomas S. Miller*
주제: spectroscopic ellipsometry
저자: András Bojtor, Dávid Krisztián, Gábor Paráda, Ferenc Korsós, Sándor Kollarics, Gábor Csősz, Bence G. Márkus, László Forró, Ferenc Simon
주제: uPCD
저자: Maximiliano Jesus Jara Fornerod, Alberto Alvarez-Fernandez, Máté Füredi, Anandapadmanabhan A Rajendran, Beatriz Prieto-Simón, Nicolas H. Voelcker, Stefan Guldin
주제: spectroscopic ellipsometry
