SE-1000 Spectroscopic Ellipsometry
This compact tabletop Spectroscopic Ellipsometer delivers precise thin film and optical property measurements in a modular, lab-friendly design. Covering a wide spectral range, it supports film thickness, refractive index, extinction ratio coefficient , and multilayer analysis with flexible measurement modes including ellipsometry, polarimetry, and twelve element Mueller-matrix.
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Journal of Materials Chemistry C, Royal Society of Chemistry2024
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