A Novel Pretreatment for Thin-Film Measurements
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SE-2000 是一款模块化光谱椭偏仪，是一套功能极强的多功能薄膜表征系统，可在单台设备上覆盖最宽的光谱范围（190 nm – 25 µm）。该系统能够对膜厚、光学常数、多层叠层结构以及先进材料特性进行非接触、无损分析，展现出卓越的灵活性。
SE-2000 光谱椭偏仪
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