A Novel Pretreatment for Thin-Film Measurements
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这款紧凑型台式光谱椭偏仪采用模块化且实验室友好的设计，可提供精确的薄膜厚度及光学特性测量。该设备覆盖宽光谱范围，支持膜厚、折射率、消光系数以及多层结构分析，并具备椭偏测量、偏振测量及十二元素穆勒矩阵等灵活的测量模式。
SE-1000 光谱椭偏仪
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